- Target users: electronic engineers, professionals, and technical experts who require stable testing tools for their projects and product development processes. - High precision near-field detection: Field Probe designed to identify issues and enhance electromagnetic compatibility (EMC) across a wide frequency range from 9 kHz to 3 GHz. - Durable construction: robust build with a female connector and a black protective sleeve to ensure long-term, stable performance in varying testing environments. - Laboratory suitability: essential for circuit board debugging and electromagnetic interference (EMI) detection during the product development phase. - Key benefits: provides reliable near-field measurements over a broad spectrum, helps locate EMI sources, supports EMC verification, and reduces debugging iterations with a durable, field-proven design. - Specifications and features: near-field probe with 9 kHz to 3 GHz frequency coverage; includes a female connector; encased in a black protective sleeve for added durability and stability; designed for long-term use in lab and testing environments. - Practical use scenarios: - Scenario 1: In a development lab, use the Field Probe to locate EMI sources on a complex circuit board during debugging of a new device. - Scenario 2: During EMC compliance testing, employ the probe to assess and improve shielding effectiveness and identify problem frequencies across the 9 kHz to 3 GHz range. - Scenario 3: In early prototype testing, verify EMI mitigation strategies and validate stable performance of the device under typical lab conditions and test setups.